Reflection Electron Microscopy and Spectroscopy for Surface Analysis

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Description

Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM.

  • ISBN: 9780521482660
  • Format: Hardcover
  • Condition: Used; Very Good
Publication Date1996
AuthorWang, Zhong Lin
PublisherCambridge University Press
Pages458

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